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Volumn 477, Issue 1-2, 2009, Pages 846-850
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Small-angle X-ray scattering characterization of precipitates in Cu-Ti alloys
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Author keywords
Atomic scale structure; EXAFS; Precipitation; Transition metal alloys
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Indexed keywords
AGING CHARACTERISTICS;
ATOMIC CORRELATIONS;
ATOMIC DISTANCES;
ATOMIC RADIUS;
ATOMIC SCALE STRUCTURE;
BASE METALS;
BULK TITANIUMS;
COPPER MATRIXES;
CU-TI ALLOYS;
ELECTRICAL RESISTIVITIES;
EXAFS;
EXTENDED X-RAY ABSORPTION FINE STRUCTURES;
GROWTH BEHAVIORS;
HIGH PURITIES;
INTERMETALLIC COMPOUNDS;
LOCAL STRUCTURES;
NUMBER DENSITIES;
PRECIPITATE SIZES;
PRECIPITATION;
PRECIPITATION RATES;
SMALL - ANGLE X-RAY SCATTERINGS;
SOLUTION TREATMENTS;
TI ALLOYS;
ALLOYS;
ATOMS;
CERIUM ALLOYS;
COPPER;
COPPER ALLOYS;
DISSOLUTION;
ELECTRIC RESISTANCE;
IMPLANTS (SURGICAL);
METAL ANALYSIS;
METALLIC MATRIX COMPOSITES;
PRECIPITATES;
PRECIPITATION (CHEMICAL);
SCATTERING;
SEMICONDUCTING INTERMETALLICS;
SOLDERING ALLOYS;
SOLID SOLUTIONS;
TITANIUM;
X RAY ANALYSIS;
X RAY SCATTERING;
TITANIUM ALLOYS;
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EID: 67349209525
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.10.158 Document Type: Article |
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Times cited : (10)
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References (12)
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