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Volumn 165, Issue 3-4, 2009, Pages 265-270

Detection of trace impurities in Cu(In, Ga)Se2 thin film solar cells by laser ablation ICP-MS

Author keywords

CIGS; LA ICP MS; PIXE; Solar cell; Trace elements

Indexed keywords


EID: 67349148912     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-008-0131-1     Document Type: Article
Times cited : (9)

References (13)
  • 1
    • 39749133566 scopus 로고    scopus 로고
    • Colloidal nanocrystal solar cells
    • S Kumar GD Scholes 2008 Colloidal nanocrystal solar cells Microchim Acta 160 315
    • (2008) Microchim Acta , vol.160 , pp. 315
    • Kumar, S.1    Scholes, G.D.2
  • 3
    • 67349273759 scopus 로고    scopus 로고
    • www.wuerth-solar.de
  • 7
    • 0000835559 scopus 로고    scopus 로고
    • Depth profile analysis of various Ti based coatings on steel and tungsten carbide using Laser ablation inductively coupled plasma-"time-of- flight" mass spectrometry
    • D Bleiner A Plotnikov C Vogt K Wetzig D Günther 2000 Depth profile analysis of various Ti based coatings on steel and tungsten carbide using Laser ablation inductively coupled plasma-"time-of-flight" mass spectrometry Fresenius J Anal Chem 368 221
    • (2000) Fresenius J Anal Chem , vol.368 , pp. 221
    • Bleiner, D.1    Plotnikov, A.2    Vogt, C.3    Wetzig, K.4    Günther, D.5
  • 10
    • 0034743175 scopus 로고    scopus 로고
    • Theoretical description and experimental observation of aerosol transport processes in laser ablation inductively coupled plasma mass spectrometry
    • D Bleiner D Günther 2001 Theoretical description and experimental observation of aerosol transport processes in laser ablation inductively coupled plasma mass spectrometry J Anal At Spectrom 16 449
    • (2001) J Anal at Spectrom , vol.16 , pp. 449
    • Bleiner, D.1    Günther, D.2
  • 11
    • 0006741101 scopus 로고
    • General aspects of trace analytical methods-IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques
    • GH Morrison KL Cheng M Grasserbauer 1979 General aspects of trace analytical methods-IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques Pure Appl Chem 51 2243
    • (1979) Pure Appl Chem , vol.51 , pp. 2243
    • Morrison, G.H.1    Cheng, K.L.2    Grasserbauer, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.