Microstructural characterisation of titanium coatings deposited using cold gas spraying on Al2O3 substrates

Surface and Coatings Technology

Volumn 203, Issue 20-21, 2009, Pages 3206-3213

  Rafaja, David ^a   Schucknecht, Torsten ^a   Klemm, Volker ^a   Paul, Alexander ^b   Berek, Harry ^b  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b GfE Fremat GmbH   (Germany)

Author keywords

Aluminium oxide; Cold gas spraying process; Titanium; Transmission electron microscopy; X ray diffraction

Indexed keywords

ALUMINIUM OXIDE; BEFORE AND AFTER; COLD GAS; COLD GAS SPRAYING; COLD GAS SPRAYING PROCESS; DISLOCATION DENSITIES; ELECTRON BACK SCATTER DIFFRACTION; GRAIN SIZE; HETEROEPITAXIAL GROWTH; MICRO-STRAIN; MICROSTRUCTURAL CHARACTERISATION; MICROSTRUCTURE DEFECTS; MICROSTRUCTURE FORMATION; MISORIENTATIONS; MUTUAL ORIENTATION; NANOCRYSTALLINE; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; STORED ENERGY; TI COATING; TITANIUM COATING; TITANIUM PARTICLES;

ALUMINUM; CORUNDUM; CRYSTALLITES; DIFFRACTION; ELECTRON MICROSCOPES; ELECTRONS; EPITAXIAL GROWTH; GASES; HEMATITE; MICROSTRUCTURE; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; SCANNING; SCANNING ELECTRON MICROSCOPY; SPRAYED COATINGS; SUBSTRATES; TITANIUM; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

INTEGRATED OPTOELECTRONICS;

EID: 67349129700     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.03.054     Document Type: Article

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