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Volumn 44, Issue 7, 2009, Pages 1800-1812

Depth profile XPS analysis of polymeric materials by C60 + ion sputtering

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; DAMAGE MODES; DEGREE OF DAMAGES; DEPTH PROFILES; ETHER GROUPS; ION-SPUTTERING; POLYMERIC MATERIALS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS ANALYSIS;

EID: 67349117326     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-009-3274-5     Document Type: Article
Times cited : (40)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.