|
Volumn 44, Issue 7, 2009, Pages 1800-1812
|
Depth profile XPS analysis of polymeric materials by C60 + ion sputtering
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHEMICAL COMPOSITIONS;
DAMAGE MODES;
DEGREE OF DAMAGES;
DEPTH PROFILES;
ETHER GROUPS;
ION-SPUTTERING;
POLYMERIC MATERIALS;
X-RAY PHOTOELECTRON SPECTROSCOPIES;
XPS ANALYSIS;
AROMATIC POLYMERS;
BIOPOLYMERS;
CARBONIZATION;
ETHERS;
FLUORINE;
FUNCTIONAL GROUPS;
FUNCTIONAL POLYMERS;
IONS;
SPUTTERING;
X RAY PHOTOELECTRON SPECTROSCOPY;
FLUORINE CONTAINING POLYMERS;
|
EID: 67349117326
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-009-3274-5 Document Type: Article |
Times cited : (40)
|
References (22)
|