Spatially resolved detection of a nanometer-scale gap by scanning electrochemical microscopy

Analytical Chemistry

Volumn 81, Issue 12, 2009, Pages 4788-4791

  Kim, Eunkyoung ^a,b   Kim, Jiyeon ^a   Amemiya, Shigeru ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONDUCTIVITY; ELECTRON TRANSPORT; FEEDBACK EFFECTS; FEEDBACK MODE; MODEL SYSTEM; NANO-GAP; NANO-MATERIALS; NANO-METER-SCALE; NANOMETER-SCALE GAPS; NUMERICAL SIMULATION; PEAK CURRENTS; POTENTIAL APPLICATIONS; SCANNING ELECTROCHEMICAL MICROSCOPY; SPATIALLY RESOLVED;

ELECTRIC CONDUCTIVITY; ELECTRIC WIRE; SCANNING; SCANNING PROBE MICROSCOPY;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; ELECTRIC CONDUCTIVITY; SCANNING ELECTROCHEMICAL MICROSCOPY; SIMULATION;

ELECTRIC CONDUCTIVITY; GOLD; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; NANOWIRES;

EID: 67249104060     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac900349f     Document Type: Article

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