Micro-XRF excitation in an SEM

X-Ray Spectrometry

Volumn 36, Issue 4, 2007, Pages 254-259

  Haschke, M ^a   Eggert, F ^b   Elam, W T ^c  

^a Institute for Scientific Instruments GmbH   (Germany)

^b LEIBNIZ INSTITUT FÜR KATALYSE E V AN DER UNIVERSITÄT ROSTOCK   (Germany)

^c EDAX Mahwah   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL ELEMENTS; ELECTRON PROBE MICROANALYSIS; SCANNING ELECTRON MICROSCOPY;

ELECTRON PROBE MICROANALYSES; LIGHT ELEMENTS; MICRO-XRF; MICROMETER RANGES; NON-HOMOGENEOUS MATERIAL; POSITION SENSITIVE; SCANNING ELECTRONS; SPOT SIZES; X-RAY BEAM; X-RAY OPTICS;

ELECTRONS;

EID: 34547474235     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.974     Document Type: Article

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