A global sensitivity analysis of three- and four-layer EEG conductivity models

IEEE Transactions on Biomedical Engineering

Volumn 56, Issue 4, 2009, Pages 988-995

  Vallaghé, Sylvain ^a   Clerc, Maureen ^a,b  

^a INRIA   (France)

^b UNIVERSITÉ PARIS EST   (France)

Author keywords

Conductivity; EEG; Electrical impedance tomography (EIT); Sensitivity analysis; Variance based methods

Indexed keywords

CONDUCTIVITY; CONDUCTIVITY MODELS; CURRENT INJECTIONS; EEG; ELECTRICAL IMPEDANCE TOMOGRAPHY; ELECTRICAL IMPEDANCE TOMOGRAPHY (EIT); FORWARD MODELS; GLOBAL SENSITIVITY ANALYSIS; INPUT PARAMETER; MODEL OUTPUTS; MODEL REFINEMENT; NON-LINEAR MODEL; SKULL ANISOTROPY; TIME VARIATIONS; VARIANCE-BASED METHODS; VARIANCE-BASED SENSITIVITY ANALYSIS;

DIAGNOSTIC RADIOGRAPHY; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTROENCEPHALOGRAPHY;

SENSITIVITY ANALYSIS;

ANISOTROPY; ARTICLE; COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; DIPOLE; ELECTRIC CONDUCTIVITY; ELECTROENCEPHALOGRAM; HUMAN; NONLINEAR SYSTEM; SCALP; SKULL; VARIANCE;

ALGORITHMS; BRAIN MAPPING; CALIBRATION; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROENCEPHALOGRAPHY; MODELS, NEUROLOGICAL; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 67149116700     PISSN: 00189294     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBME.2008.2009315     Document Type: Article

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