Estimating brain conductivities and dipole source signals with EEG arrays

IEEE Transactions on Biomedical Engineering

Volumn 51, Issue 12, 2004, Pages 2113-2122

  Gutiérrez, David ^a,b,d,e   Nehorai, Arye ^b,f,g,h,i   Muravchik, Carlos H ^{b,c,g,j,k,l,m}  

^a University of Illinois at Chicago   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^c UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

^d UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^e Unidad Durango   (Mexico)

^f TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^g STANFORD UNIVERSITY   (United States)

^h Systems Control Technology Inc   (United States)

ⁱ Yale University   (United States)

^j UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

^k Yale University ^*  (Argentina)

^l National University of La Plata ^*  (Argentina)

^m YALE UNIVERSITY   (United States)

more..

Author keywords

Brain conductivities; Cram r Rao bound; Electroencephalography; Maximum likelihood estimation; Parameter estimation; Sensor array processing

Indexed keywords

CONDUCTIVITY RATIOS; NEURAL ACTIVITY; STANDARD DEVIATION;

ELECTROENCEPHALOGRAPHY; NEURAL NETWORKS; STATISTICAL METHODS; TISSUE;

BRAIN;

ARTICLE; BRAIN CELL; CONDUCTANCE; DIPOLE; ELECTRIC POTENTIAL; ELECTROENCEPHALOGRAM; GEOMETRY; HUMAN; MAXIMUM LIKELIHOOD METHOD; SENSITIVITY ANALYSIS; SIMULATION; SKULL; STANDARDIZATION; THICKNESS;

BRAIN; BRAIN MAPPING; COMPUTER SIMULATION; DIAGNOSIS, COMPUTER-ASSISTED; ELECTRIC CONDUCTIVITY; ELECTROENCEPHALOGRAPHY; HUMANS; MODELS, NEUROLOGICAL; MODELS, STATISTICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 9644307843     PISSN: 00189294     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBME.2004.836507     Document Type: Article

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