In vivo measurement of the brain and skull resistivities using an EIT-based method and the combined analysis of SEF/SEP data

IEEE Transactions on Biomedical Engineering

Volumn 50, Issue 9, 2003, Pages 1124-1128

  Goncalves S ^a,b   De Munck, J C ^a   Verbunt, J P A ^a   Heethaar, R M ^c   Lopes da Silva, F H ^d  

^a VU UNIVERSITY MEDICAL CENTER   (Netherlands)

^b UNIVERSITY OF LISBON   (Portugal)

^c VU UNIVERSITY MEDICAL CENTER   (Netherlands)

^d Institute for Neurobiology   (Netherlands)

Author keywords

EEG inverse problem; Electric impedance tomography; Electrical resistivities; Somatosensory evoked responses; Three layer sphere head model

Indexed keywords

BRAIN; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE TOMOGRAPHY; INVERSE PROBLEMS; MATHEMATICAL MODELS;

SKULL;

BIOMEDICAL ENGINEERING;

ARTICLE; BRAIN ELECTROPHYSIOLOGY; COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; ELECTRIC RESISTANCE; ELECTROENCEPHALOGRAPHY; EVOKED CORTICAL RESPONSE; EVOKED SOMATOSENSORY RESPONSE; HUMAN; HUMAN EXPERIMENT; IN VIVO STUDY; MAGNETOENCEPHALOGRAPHY; NORMAL HUMAN; PARAMETER; SKULL;

BRAIN; BRAIN MAPPING; ELECTRIC IMPEDANCE; ELECTROENCEPHALOGRAPHY; EVOKED POTENTIALS, SOMATOSENSORY; HEAD; MODELS, BIOLOGICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SKIN PHYSIOLOGY; SKULL; TOMOGRAPHY;

EID: 0037868559     PISSN: 00189294     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBME.2003.816072     Document Type: Article

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