A new phase-field model for strongly anisotropic systems

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 465, Issue 2105, 2009, Pages 1337-1359

  Torabi, Solmaz ^a   Lowengrub, John ^a,b   Voigt, Axel ^c   Wise, Steven ^d  

^a University of California at Irvine   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^d UNIVERSITY OF TENNESSEE   (United States)

Author keywords

Cahn Hilliard equations; Interfacial anisotropy; Phase field; Quantum dots; Thin film; Willmore regularization

Indexed keywords

ANISOTROPY; ASYMPTOTIC ANALYSIS; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; SEMICONDUCTOR QUANTUM DOTS; SINGLE CRYSTALS; SURFACE CHEMISTRY; SURFACE TENSION; THIN FILM DEVICES; THIN FILMS;

CAHN-HILLIARD EQUATIONS; INTERFACIAL ANISOTROPY; PHASE FIELD; QUANTUM DOTS; WILLMORE REGULARIZATION;

PHASE INTERFACES;

EID: 67149103783     PISSN: 13645021     EISSN: 14712946     Source Type: Journal    
DOI: 10.1098/rspa.2008.0385     Document Type: Article

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