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Volumn 34, Issue 11, 2009, Pages 2422-2425
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Detailed numerical simulation of the effect of defects created by electron irradiation on the performance degradation of a p+-n-n+ GaAs solar cell
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Author keywords
Degradation; Electron irradiation; GaAs; Solar cell
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Indexed keywords
DEEP ELECTRON TRAPS;
ELECTRON AND HOLE TRAPS;
FILL FACTOR;
GAAS;
GAAS SOLAR CELLS;
IRRADIATION-INDUCED DEFECTS;
IRRADIATION-INDUCED DEGRADATION;
NUMERICAL SIMULATION;
OUTPUT PARAMETERS;
PERFORMANCE DEGRADATION;
RECOMBINATION CENTRES;
SIMULATION RESULT;
SOLAR CELL OUTPUT PARAMETERS;
STRUCTURAL DEFECT;
TRAP LEVELS;
CONVERSION EFFICIENCY;
CURRENT VOLTAGE CHARACTERISTICS;
DEFECTS;
DEGRADATION;
ELECTRONS;
GALLIUM ALLOYS;
PHOTOVOLTAIC CELLS;
RADIATION;
SEMICONDUCTING GALLIUM;
SOLAR CELLS;
SOLAR ENERGY;
STRONTIUM COMPOUNDS;
ELECTRON IRRADIATION;
DEGRADATION;
EFFICIENCY MEASUREMENT;
ELECTRON;
IRRADIATION;
NUMERICAL MODEL;
PERFORMANCE ASSESSMENT;
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EID: 67149090902
PISSN: 09601481
EISSN: None
Source Type: Journal
DOI: 10.1016/j.renene.2009.03.019 Document Type: Article |
Times cited : (4)
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References (12)
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