SCOPUS 정보 검색 플랫폼

Semiconductor Science and Technology

Volumn 17, Issue 5, 2002, Pages 453-460

Irradiation-induced degradation in solar cell: Characterization of recombination centres

(2) Bourgoin, J C a Zazoui, M b

a SORBONNE UNIVERSITÉ (France)

b HASSAN II UNIVERSITY OF CASABLANCA (Morocco)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CURRENT VOLTAGE CHARACTERISTICS; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEGRADATION; ELECTRON IRRADIATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SILICON; SHORT CIRCUIT CURRENTS;

IRRADIATION-INDUCED DEGRADATION;

SOLAR CELLS;

EID: 0036566754 PISSN: 02681242 EISSN: None Source Type: Journal
DOI: 10.1088/0268-1242/17/5/308 Document Type: Article

Times cited : (80)

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