Nanomanipulation of single nanoparticle using a carbon nanotube probe in a scanning electron microscope

Applied Physics Express

Volumn 2, Issue 5, 2009, Pages

  Suga, Hiroshi ^a   Naitoh, Yasuhisa ^a   Tanaka, Miyuki ^a   Horikawa, Masayo ^a   Kobori, Hiromi ^b   Shimizu, Tetsuo ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b KONAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-CARBON; ELECTRICAL CONDUCTIVITY; NANO-GAP; NANO-MATERIALS; NANOMANIPULATION; NOVEL METHODS; SCANNING ELECTRON MICROSCOPE; SINGLE NANOPARTICLE;

ELECTRIC CONDUCTIVITY; IRON OXIDES; MICROMANIPULATORS; MICROSCOPES; NANOPARTICLES; NANOTECHNOLOGY; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SURFACE PLASMON RESONANCE;

CARBON NANOTUBES;

EID: 66949161834     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.2.055004     Document Type: Article

References (15)

1. N. Jeong-Seok et al.: Nanotechnology 18 (2007) 035203.
2. C. P. Bean and J. D. Livingston: J. Appl. Phys. 30 (1959) S120.
3. J. Tejada et al.: Chem. Mater. 8 (1996) 1784.
4. D. L. Peng et al.: Phys. Rev. B 60 (1999) 2093.
5. M. H. Kryder et al.: J. Appl. Phys. 79 (1996) 4485.
6. R. D. McMichael et al.: J. Magn. Magn. Mater. 111 (1992) 29.
7. D. G. J. Mitchell: J. Magn. Resonance Imaging 7 (1997) 1.
8. Ph. Avouris et al.: Appl. Surf. Sci. 141 (1999) 201.
9. S. I. Khondaker and Z. Yao: Appl. Phys. Lett. 81 (2002) 4613.
10. I. Amlani et al.: Appl. Phys. Lett. 80 (2002) 2761.
11. H. Miyazaki et al.: J. Appl. Phys. 87 (2000) 7152.
12. G. B. Adams et al.: Science 256 (1992) 1792.
13. H. Abe et al.: Physica E 24 (2004) 42.
14. H. Suga et al.: Surf. Interface Anal. 38 (2006) 1763.
15. Y. Naitoh et al.: e-J. Surf. Sci. Nanotechnol. 1 (2003) 41.