Electric transport and mechanical strength measurements of carbon nanotubes in scanning electron microscope

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 24, Issue 1-2 SPEC. ISS., 2004, Pages 42-45

  Abe, Hidekazu ^a   Shimizu, Tetsuo ^a   Ando, Atsushi ^a   Tokumoto, Hiroshi ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Carbon nanotube; Electric resistance; Low melting point metal; Mechanical strength

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRON BEAMS; MELTING; SCANNING ELECTRON MICROSCOPY; STRENGTH OF MATERIALS;

CONTACT CONDITIONS; LOW MELTING POINT MATERIAL; MULTI-WALLED CARBON NANOTUBES (MWCNT);

CARBON NANOTUBES;

EID: 3142747616     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2004.04.021     Document Type: Conference Paper

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