Particle deposition onto charge-heterogeneous substrates

Langmuir

Volumn 25, Issue 9, 2009, Pages 4907-4918

  Rizwan, Tania ^a   Bhattacharjee, Subir ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANETHIOLS; CHARGE HETEROGENEITY; COLLOIDAL PARTICLE; DEPOSIT MORPHOLOGY; DEPOSIT STRUCTURES; DEPOSITION MODELS; EXPERIMENTAL DATA; HETEROGENEOUS SUBSTRATES; HETEROGENEOUS SURFACE; MICROPATTERNS; MONTE CARLO; MONTE CARLO TECHNIQUES; PARTICLE DEPOSITIONS; PATTERNED SUBSTRATES; PHASE CONTRASTS; POLYSTYRENE NANOPARTICLES; PROBABILISTIC MODELS; RADIAL DISTRIBUTIONS; RANDOM SEQUENTIAL ADSORPTION; SOFT-LITHOGRAPHIC TECHNIQUES; STRIPE WIDTH; SURFACE CHEMICALS; THEORETICAL RESULT;

ADSORPTION; AMINES; DEPOSITS; FLUORESCENCE; FLUORESCENCE MICROSCOPY; MONTE CARLO METHODS; MORPHOLOGY; POLYSTYRENES; PROBABILITY DISTRIBUTIONS; SELF ASSEMBLED MONOLAYERS;

SUBSTRATES;

EID: 66549110406     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la804075g     Document Type: Article

References (46)

1. Kihira, H.; Ryde, N.; Matijevic, E. J. Chem. Soc., Faraday Trans. 1992. 88(16), 2379-2386.
2. Vaidyanathan, R.; Tien, C. Chem. Eng. Sci. 1991, 46(4), 967-983.
3. Vreeker, R.; Kuin, A. J.; Denboer, D. C.; Hoekstra, L. L.; Agterof, W. G. M. J. Colloid Interface Sci. 1992, 154(1), 138-145.
4. Ryan, J. N.; Elimelech, M. Colloids Surf., A: Physicochem. Eng. Aspects 1996,107, 1-56.
5. Loveland, J. P.; Bhattacharjee, S.; Ryan, J. N.; Elimelech, M. J Contam. Hydrol. 2003, 65(3), 161-182.
6. Khachatourian, A. V. M.; Wistrom, A. O. J. Phys. Chem. B1998,102 (14), 2483-2493.
7. Johnson, P. R.; Sun, N.; Elimelech, M. Environ. Sci. Techno!. 1996, 30 (11), 3284-3293.
8. Song, L. F.; Johnson, P. R.; Elimelech, M. Environ. Sci. Technol. 1994, 28(6), 1164-1171.
9. Elimelech, M.; Chen, J. Y.; Kuznar, Z. A. Langmuir 2003, 19(17), 6594-6597.
10. Nazemifard, N.; Masliyah, J. H.; Bhattacharjee, S. Langmuir2006,22 (24), 9879-9893.
11. Nazemifard, N.; Masliyah, J. H.; Bhattacharjee, S. J. Colloid Interface Sci. 2006, 293(1), 1-15.
12. Chen, J. Y.; Ko, C. H.; Bhattacharjee, S.; Elimelech, M. Colloids Surf., A: Physicochem. Eng. Aspects 2001, 191, 3-16.
13. Walker, S. L.; Bhattacharjee, S.; Hoek, E. M. V.; Elimelech, M. Langmuir 2002,18(6), 2193-2198.
14. Chen, K. M.; Jiang, X. P.; Kimerling, L. C.; Hammond, P. T. Lanemuir 2000, 16(20), 7825-7834.
15. Zheng, H. P.; Rubner, M. F.; Hammond, P. T. Langmuir 2002, 18 (11), 4505-4510.
16. Chen, J. Y.; Klemic, J. F.; Elimelech, M. Nano Lett. 2002,2(4), 393-396.
17. Clark, P. Biosens. Bioelectron. 1994, 9(9), 657-661.
18. Kruger, C.; Jonas, U. J. Colloid Interface Sci. 2002, 252(2), 331-338.
19. Scotchford, C. A.; Ball, M.; Winkelmann, M.; Voros, J.; Csucs, C. Biomaterials 2003, 24(7), 1147-1158.
20. Wright, J.; Ivanova, E.; Pham, D.; Filipponi, L.; Viezzoli, A.; Suyama, K.; Shirai, M.; Tsunooka, A.; Nicolau, D. V. Langmuir 2003, 19 (2), 446-452.
21. Shadnam, M. R.; Kirkwood, S. E.; Fedosejevs, R.; Amirfazli, A. Langmuir 2004, 20(7), 2667-2676.
22. Rhinow, D.; Hampp, N. A. IEEE Trans. Nanobiosci. 2006, 5(3), 188-192.
23. Xia, Y. N.; Whitesides, G. M. Annu. Rev. Mater. Sci. 1998, 28, 153-184.
24. Zheng, H. P.; Berg, M. C.; Rubner, M. F.; Hammond, P. T. Langmuir 2004, 20(17), 7215-7222.
25. Aizenberg, J.; Braun, P. V.; Wiltzius, P. Phys. Rev. Lett. 2000,84(13), 2997-3000.
26. Fan, F. Q.; Stebe, K. J. Langmuir 2004, 20(8), 3062-3067.
27. Fustin, C. A.; Glasser, G.; Spiess, H. W.; Jonas, U. Langmuir 2004,20 (21), 9114-9123.
28. Kumar, A.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1994,10(5), 1498-1511.
29. Lee, I.; Zheng, H. P.; Rubner, M. F.; Hammond, P. T. Adv. Mater. 2002, 14(8), 572-577.
30. Masuda, Y.; Itoh, T.; Itoh, M.; Koumoto, K. Langmuir 2004, 20(13), 5588-5592.
31. Ulman, A. Chem. Rev. 1996, 96(4), 1533-1554.
32. Tien, J.; Terfort, A.; Whitesides, G. M. Langmuir 1997,13(20), 5349-5355.
33. Michel, B.; Bernard, A.; Bietsch, A.; Delamarche, E.; Geissler, M.; Juncker, D.; Kind, H.; Renault, J. P.; Rothuizen, H.; Schmid, H.; Schmidt-Winkel, P.; Stutz, R.; Wolf, H. IBM J. Res. Dev. 2001, 45(5), 697-719.
34. Karakurt, I.; Leiderer, P.; Boneberg, J. Langmuir 2006, 22(6), 2415-2417.
35. Kokkoli, E.; Zukoski, C. F. Langmuir 2001,17(2), 369-376.
36. Evans, J. W. Rev. Mod. Phys. 1993, 65(4), 1281-1329.
37. Feder, J. J. Theor. Biol. 1980, 87(2), 237-254.
38. Allen, M. P.; Tildesley, D. J., Computer Simulation of Liquids; Oxford University Press: Oxford, 1987.
39. Kim, A. S.; Bhattacharjee, S.; Elimelech, M. Langmuir 2001, 17(2), 552-561.
40. Pathria, R. K., Statistical Mechanics; Pergamon: New York, 1972;pp 447-448.
41. Wilbur, J. L.; Kumar, A.; Kim, E.; Whitesides, G. M. Adv. Mater. 1994, 6(7-8), 600-604.
42. Zhu, P. X.; Masuda, Y.; Yonezawa, T.; Koumoto, K. J. Am. Ceram. Soc. 2003, 86(5), 782-790.
43. Cheng, S. S.; Scherson, D. A.; Sukenik, C. N. Langmuir 1995, 11(4), 1190-1195.
44. Shyue, J. J.; De Guire, M. R. Langmuir 2004, 20(20), 8693-8698.
45. Electric Force Microscopy (EFM). In Support Note No. 230 Rev. A; Digital Instruments: Santa Barbara, CA, 1996.
46. Getty, R. R.; Alvarez, R.; Bonnell, D. A.; Sharp, K. G.; Percec, S.; Hietpas, P. B. In Surface Potential Mapping Of Patterned SAMs By Scanning Probe Microscopy; MRS Symposium Proceedings-Nanostrcutured Interfaces, San Francisco, CA, 2002; pp R11.9.1-R11.9.6.