X-ray dark-field and phase-contrast imaging using a grating interferometer

Journal of Applied Physics

Volumn 105, Issue 10, 2009, Pages

  Pfeiffer, F ^a   Bech, M ^b   Bunk, O ^c   Donath, T ^c   Henrich, B ^c   Kraft, P ^c   David, C ^c  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DARK-FIELD; FULLY COMPATIBLE; GRATING INTERFEROMETERS; HARD X RAY; IMAGE CONTRASTS; NON DESTRUCTIVE TESTING; PHASE-CONTRAST IMAGING; SECURITY SCREENING; SMALL-ANGLE SCATTERING; STRUCTURAL INFORMATION; SUBMICRON LENGTH; X-RAY DARK FIELD IMAGING; X-RAY MEDICAL IMAGING; X-RAY TUBE SOURCE;

MEDICAL IMAGING; NONDESTRUCTIVE EXAMINATION; X RAY TUBES; X RAYS;

X RAY RADIOGRAPHY;

EID: 66549097082     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3115639     Document Type: Article

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