Temperature dependence of the dielectric permittivity of CaF2, BaF2 and Al2O3: Application to the prediction of a temperature-dependent van der Waals surface interaction exerted onto a neighbouring Cs(8P3/2) atom

Journal of Physics Condensed Matter

Volumn 21, Issue 25, 2009, Pages

  Passerat De Silans, Thierry ^a   Maurin, Isabelle ^a   Chaves De Souza Segundo, Pedro ^a   Saltiel, Solomon ^a,b   Gorza, Marie Pascale ^a   Ducloy, Martial ^a   Bloch, Daniel ^a   De Sousa Meneses, Domingos ^c,d   Echegut, Patrick ^c  

^a UNIVERSITÉ PARIS 13   (France)

^b UNIVERSITY OF SOFIA   (Bulgaria)

^c CNRS   (France)

^d UNIVERSITÉ D'ORLÉANS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PERMITTIVITIES; INFRARED RANGE; MULTIPHONON; REFLECTIVITY MEASUREMENTS; REFLECTIVITY SPECTRA; RESTSTRAHLEN BAND; SURFACE INTERACTIONS; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; THERMAL RADIATIONS; VAN DER WAALS; VAN DER WAALS INTERACTIONS; VIRTUAL COUPLING;

ALUMINUM; ATOMS; CESIUM; REFLECTION; VAN DER WAALS FORCES;

PERMITTIVITY;

EID: 66349123828     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/25/255902     Document Type: Article

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