Electrostatic screening and charge correlation effects in micellization of ionic surfactants

Journal of Physical Chemistry B

Volumn 113, Issue 18, 2009, Pages 6314-6320

  Jusufi, Arben ^a   Hynninen, Antti Pekka ^a   Haataja, Mikko ^a   Panagjotopoulos, Athanassios Z ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANIONIC SURFACTANTS; CATIONIC SURFACTANTS; CONCENTRATION (PROCESS); CORRELATION DETECTORS; CRITICAL MICELLE CONCENTRATION; DIFFUSERS (OPTICAL); DYES; ELECTROSTATICS; MICELLES; MONTE CARLO METHODS; SODIUM CHLORIDE; SODIUM SULFATE;

AGGREGATE SIZE; AGGREGATION NUMBERS; ATOMISTIC SIMULATIONS; CHARGE CORRELATION; CORRELATION EFFECT; CRITICAL MICELLE CONCENTRATION (CMC); DODECYLTRIMETHYLAMMONIUM CHLORIDE; ELECTROSTATIC SCREENING; EXPERIMENTAL DATA; EXPERIMENTAL OBSERVATION; GRAND CANONICAL MONTE CARLO SIMULATION; IONIC SURFACTANTS; LOW SALT CONCENTRATION; LOW-TO-HIGH; MICELLAR PROPERTIES; POTENTIAL MODEL; SALT CONCENTRATION; SELF ASSEMBLY PROCESS; SODIUM DODECYL SULFATE; YUKAWA MODEL;

SIMULATORS;

EID: 66349113773     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp901032g     Document Type: Article

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