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Chinese Optics Letters

Volumn 7, Issue 5, 2009, Pages 432-434

Optoelectronic characterization of ZnS/PS systems

(3) Wang, Caifeng a Li, Qingshan b Hu, Bo a

a BINZHOU UNIVERSITY (China)

b LUDONG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE SHIFT; FORWARD CURRENTS; GREEN EMISSIONS; IV CHARACTERISTICS; JUNCTION CURRENTS; OPTOELECTRONIC CHARACTERIZATION; PHOTOLUMINESCENCE SPECTRUM; PL INTENSITY; PL SPECTRA; RECTIFYING BEHAVIORS; ROOM TEMPERATURE; ZNS FILMS; ZNS THIN FILMS;

DISTILLATION; EMISSION SPECTROSCOPY; POROSITY; POROUS SILICON; PULSED LASER DEPOSITION; SEMICONDUCTING SILICON COMPOUNDS; ZINC SULFIDE;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 66349111429 PISSN: 16717694 EISSN: None Source Type: Journal
DOI: 10.3788/COL20090705.0432 Document Type: Article

Times cited : (8)

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