Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

Applied Surface Science

Volumn 255, Issue 17, 2009, Pages 7517-7523

  Soundararajan, D ^a   Mangalaraj, D ^a   Nataraj, D ^a   Dorosinskii, L ^b   Santoyo Salazar, J ^c,d   Jeon, H C ^e   Kang, T W ^e  

^a BHARATHIAR UNIVERSITY   (India)

^b NATIONAL METROLOGY INSTITUTE   (Turkey)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^d CNRS   (France)

^e Dongguk University   (South Korea)

Author keywords

Dilute magnetic semiconductors; M H curve; Magnetic domains; ZnTe:Cr film

Indexed keywords

CHROMIUM COMPOUNDS; ELECTRON SPIN RESONANCE SPECTROSCOPY; FILM PREPARATION; GLASS; II-VI SEMICONDUCTORS; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; MAGNETOMETRY; QUANTUM INTERFERENCE DEVICES; SQUIDS; SUBSTRATES; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

AVERAGE VALUES; CR FILM; DILUTE MAGNETIC SEMICONDUCTORS; GLASS SUBSTRATES; M-H CURVE; MAGNETIC STUDIES; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETRY; THERMAL EVAPORATION METHOD;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 66049123332     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.04.012     Document Type: Article

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