Microwave characterization of thin ferroelectric films without electrodes by composite dielectric resonator

Integrated Ferroelectrics

Volumn 98, Issue 1, 2008, Pages 53-61

  Bovtun, V ^a   Veljko, S ^a   Axelsson, A ^b   Kamba, S ^a   Alford, N ^b   Petzelt, J ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Composite dielectric resonator; Ferroelectrics; Microwave characterization; Thin film

Indexed keywords

COMPOSITE DIELECTRIC RESONATOR; COMPOSITE DIELECTRICS; DIELECTRIC PERMITTIVITIES; FERROELECTRICS; MICROWAVE CHARACTERIZATION; SAPPHIRE SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE;

BARIUM TITANATE; COMPOSITE FILMS; CORUNDUM; DIELECTRIC RESONATORS; ELECTRODES; FERROELECTRIC DEVICES; FERROELECTRICITY; MICROWAVE DEVICES; MICROWAVES; THIN FILM DEVICES; THIN FILMS; TITANIUM OXIDES;

FERROELECTRIC FILMS;

EID: 65949106803     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584580802092225     Document Type: Article

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