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Volumn , Issue , 2009, Pages 653-657

High-temperature high-power operation of a 100 A SiC DMOSFET module

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL MARKETPLACE; DC-DC BOOST CONVERTERS; DMOSFET; HIGH BREAKDOWN VOLTAGE; HIGH OPERATING TEMPERATURE; HIGH TEMPERATURE; HIGH-CURRENT; HIGH-POWER OPERATION; HIGH-TEMPERATURE POWER; HYBRID ELECTRIC VEHICLE; JUNCTION BARRIER SCHOTTKY; LIQUID COOLANT; LOW LOSS; MATERIAL PROCESSING; MOSFETS; NEW HIGH; POWER ELECTRONIC DEVICES;

EID: 65949090752     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2009.4802729     Document Type: Conference Paper
Times cited : (40)

References (15)
  • 1
    • 0035279619 scopus 로고    scopus 로고
    • "SiC Power Diodes Provide Breakthrough Performance for a Wide Range of Applications"
    • March
    • A.R. Hefner, et al., "SiC Power Diodes Provide Breakthrough Performance for a Wide Range of Applications", IEEE Transactions on Power Electronics, Vol. 16, No. 2, March 2001, pp. 273-280.
    • (2001) IEEE Transactions on Power Electronics , vol.16 , Issue.2 , pp. 273-280
    • Hefner, A.R.1
  • 9
    • 39749106640 scopus 로고    scopus 로고
    • "1200V IGBTs operating at 200°C? An investigation on the potentials and the design constraints,"
    • U. Schlapbach, M. Rahimo, C. von Arx, A. Mukhitdinov, and S. Linder, "1200V IGBTs operating at 200°C? An investigation on the potentials and the design constraints," ISPSD, 2007, pp. 9-12.
    • (2007) ISPSD, 2007 , pp. 9-12
    • Schlapbach, U.1    Rahimo, M.2    Von Arx, C.3    Mukhitdinov, A.4    Linder, S.5
  • 14
    • 49249110238 scopus 로고    scopus 로고
    • "Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability,"
    • A.J. Lelis, et al., "Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability," IEEE Transactions on Electron Devices, Vol. 55, No. 8, 2008, pp. 1835-1840.
    • (2008) IEEE Transactions on Electron Devices , vol.55 , Issue.8 , pp. 1835-1840
    • Lelis, A.J.1
  • 15
    • 34648813004 scopus 로고    scopus 로고
    • Validation of infrared camera thermal measurements on high-voltage power electronic components
    • DOI 10.1109/TIM.2007.903590
    • T. E. Salem, D. Ibitayo, and B. R. Geil, "Validation of Infrared Camera Thermal Measurements on High-Voltage Power Electronic Components", IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 5, Oct. 2007, pp. 1973-1978. (Pubitemid 47455926)
    • (2007) IEEE Transactions on Instrumentation and Measurement , vol.56 , Issue.5 , pp. 1973-1978
    • Salem, T.E.1    Ibitayo, D.2    Geil, B.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.