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Volumn 517, Issue 17, 2009, Pages 4921-4925
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Optimization of sputtered Cr/Au thin film for diaphragm-based MEMS applications
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Author keywords
Cr Au thin film; Diaphragm; MEMS; Sputtering; Stress optimization
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Indexed keywords
AIR-GAP;
CAPACITANCE CHANGE;
COMPRESSIVE FILMS;
CR/AU THIN FILM;
DEVICE CHARACTERIZATION;
FABRICATED DEVICE;
FILM STRESS;
LOW STRESS;
MEMS APPLICATIONS;
OPTIMIZATION STUDIES;
PROCESS PRESSURE;
CAPACITANCE;
DC-DC CONVERTERS;
MEMS;
MICROELECTROMECHANICAL DEVICES;
MOLECULAR BEAM EPITAXY;
OPTIMIZATION;
SILICON NITRIDE;
THIN FILM DEVICES;
THIN FILMS;
DIAPHRAGMS;
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EID: 65749095396
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.03.151 Document Type: Article |
Times cited : (36)
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References (14)
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