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Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 14, 2009, Pages

TEM and EELS measurements of interface roughness in epitaxial Fe/MgO/Fe magnetic tunnel junctions

(11) Serin, V a Andrieu, S b Serra, R a Bonell, F b Tiusan, C b Calmels, L a Varela, M c Pennycook, S J c Snoeck, E a Walls, M d Colliex, C d

a CEMES CNRS (France)

b UNIVERSITÉ DE LORRAINE (France)

c OAK RIDGE NATIONAL LABORATORY (United States)

d UNIVERSITÉ PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649144183 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.79.144413 Document Type: Article

Times cited : (34)

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