Structural characterization of thin film ferromagnetic tunnel junctions

Journal of Applied Physics

Volumn 83, Issue 10, 1998, Pages 5154-5158

  Smith, David J ^a   McCartney, M R ^a   Platt, C L ^b   Berkowitz, A E ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001490551     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367333     Document Type: Article

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