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Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 79, Issue 4, 2009, Pages

Atom microscopy via two-photon spontaneous emission spectroscopy

(3) Qamar, Sajid a,b Evers, Jörg a,b Zubairy, M Suhail a,c

a Department of Electrical Computer Engineering (Pakistan)

b MAX PLANCK INSTITUT FÜR KERNPHYSIK (Germany)

c TEXAS A AND M UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC DIFFERENCE; CORRELATED PAIRS; EXPERIMENTAL MEASUREMENTS; MODEL SYSTEM; PARTICLE POSITION; PHOTON CORRELATION; PHOTON PAIRS; POSITION DETERMINATION; POSITION INFORMATION; RAMAN PROCESS; SINGLE ATOMS; SPONTANEOUS EMISSION SPECTRUM; SUB-WAVELENGTH; THREE LEVEL ATOMS; TWO PHOTON; TYPE SYSTEMS;

ATOMS; EMISSION SPECTROSCOPY; MOLECULAR SPECTROSCOPY; MULTIPHOTON PROCESSES; PHOTONS; POSITION MEASUREMENT; PROBABILITY DISTRIBUTIONS; SPECTRUM ANALYSIS; SPONTANEOUS EMISSION;

ATOMIC SPECTROSCOPY;

EID: 65649116258 PISSN: 10502947 EISSN: 10941622 Source Type: Journal
DOI: 10.1103/PhysRevA.79.043814 Document Type: Article

Times cited : (30)

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