Nanoscale resolution fluorescence microscopy using electromagnetically induced transparency

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 76, Issue 4, 2007, Pages

  Yavuz, D D ^a   Proite, N A ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; SENSITIVITY ANALYSIS; TRANSPARENCY; WAVELENGTH;

ATOMIC EXCITATION; NANOMETER-SIZE OBJECTS; SCANNING FLUORESCENCE MICROSCOPE;

FLUORESCENCE MICROSCOPY;

EID: 35448947140     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.76.041802     Document Type: Article

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