The microstructure origin of large strain plastically deformed SiC nanowires

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Fu, Xin ^a,b   Jiang, Jun ^a,b   Hu, Xuerang ^a,b   Yuan, Jun ^a,b   Zhang, Yuefei ^b,c   Han, Xiaodong ^b,c   Zhang, Ze ^b,c  

^a TSINGHUA UNIVERSITY   (China)

^b National Centre for Electron Microscopy at Beijing   (China)

^c BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649108616     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012072     Document Type: Article

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5. Muto S and Tanabe T 2003 J. Appl. Phys 93 3765-75
6. Egerton R F 1996 Electron Energy-loss Spectroscopy in the Electron Microscope (Plenum Press New York) p 152