Gaining efficiency and resolution in soft X-ray emission spectrometers thanks to directly illuminated CCD detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 570, Issue 1, 2007, Pages 176-181

  Dinardo, M E ^a   Piazzalunga, A ^a   Braicovich, L ^a   Bisogni, V ^a   Dallera, C ^a   Giarda, K ^a   Marcon, M ^a   Tagliaferri, A ^a   Ghiringhelli, G ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

CCD detector; X ray emission spectroscopy; X ray spectrometer

Indexed keywords

CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; EMISSION SPECTROSCOPY; OPTICAL RESOLVING POWER; PHOTODETECTORS; X RAY SPECTROSCOPY;

DETECTOR PIXEL SIZES; MICROCHANNEL PLATE (MCP) DETECTORS; SOFT X-RAY PHOTON DETECTION; X-RAY SPECTROMETERS;

SPECTROMETERS;

EID: 33845446337     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.10.024     Document Type: Article

References (22)

1. Butorin S.M., Guo J.H., Magnuson M., Kuiper P., and Nordgren J. Phys. Rev. B 54 (1996) 4405
2. Braicovich L., van der Laan G., Ghiringhelli G., Tagliaferri A., van Veenendaal M.A., Brookes N.B., Chervinskii M.M., Dallera C., De Michelis B., and Dürr H.A. Phys. Rev. Lett. 82 (1999) 1566
3. Kuiper P., Guo J.-H., Såthe C., Duda L.-C., Nordgren J., Pothuizen J.J.M., de Groot F.M.F., and Sawatzky G.A. Phys. Rev. Lett. 80 (1998) 5204
4. Ghiringhelli G., Brookes N.B., Annese E., Berger H., Dallera C., Grioni M., Perfetti L., Tagliaferri A., and Braicovich L. Phys. Rev. Lett. 92 (2004) 117406
5. Ghiringhelli G., Matsubara M., Dallera C., Fracassi F., Tagliaferri A., Brookes N.B., Kotani A., and Braicovich L. Phys. Rev. B 73 (2006) 035111
6. Dallera C., Puppin E., Fasana A., Trezzi G., Incorvaia N., Braicovich L., Brookes N.B., and Goedkoop J.B. J. Synchrotron Radiat. 3 (1996) 231
7. Nordgren J., Bray J., Gramm S., Nyholm R., Rubensson J.-E., and Wassdahl N. Rev. Sci. Instrum. 60 (1989) 1690
8. Shin S., Agui A., Fujisawa M., Tezuka Y., and Ishii T. Rev. Sci. Instrum. 66 (1995) 1584
9. Cocco D., Matteucci M., Prince K.C., and Zangrando M. Proc. Soc. Photo-Opt. Inst. Eng. 4506 (2001) 46
10. Cocco D., et al. AIP Conf. Proc. 705 (2004) 873
11. Hague C.F., Underwood J.H., Avila A., Delaunay R., Ringuenet H., Marsi M., and Sacchi M. Rev. Sci. Instrum. 76 (2005) 023110
12. Schriever G., Lebert R., Naweed A., Mager S., Neff W., Kraft S., Scholze F., and Ulm G. Rev. Sci. Instrum. 68 (1997) 3301
13. Sasaki T.A., Chugan N., and Muramatsu Y. Nucl. Instr. and Meth. A 467-468 (2001) 1489
14. ROPER Scientific, Princeton Instruments.
15. Ghiringhelli G., Tagliaferri A., Braicovich L., and Brookes N.B. Rev. Sci. Instrum. 69 (1998) 1610
16. Strauss M.G., Naday I., Sherman I.S., Kreimer M.K., Westbrook E.M., and Zaluzec N.J. Nucl. Instr. and Meth. A 266 (1988) 563
17. Holland A.D., Lumb D.H., and Castelli M.C. Proc. SPIE 1159 (1989) 113
18. Jansen F.A., Heppener M., Aarts H.J.M., and de Korte P.A.J. Proc. SPIE 1159 (1989) 105
19. Owens A., Abbey A.F., Brauninger H., et al. J. X-ray Sci. Technol. 6 (1996) 269
20. Skinner C.H., and Schwob J.L. Appl. Opt. 35 (1996) 4321
21. Kraft R.P., Nousek J.A., Lumb D.H., Burrows D.N., Skinner M.A., and Garmire G.P. Nucl. Instr. and Meth. A 366 (1995) 192
22. Burke B.E., Mountain R.W., Daniels P.J., Cooper M.J., and Dolat V.S. IEEE Trans. Nucl. Sci. NS-41 (1994) 375