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Volumn 517, Issue 18, 2009, Pages 5431-5434

Direct current electrical conduction mechanism in plasma polymerized thin films of tetraethylorthosilicate

Author keywords

Electrical properties and measurements; Plasma polymerization; Tetraethylorthosilicate; Thin films

Indexed keywords

APPLIED VOLTAGES; BAND GAPS; CAPACITIVELY COUPLED; CURRENT DENSITY-VOLTAGE CHARACTERISTICS; DIRECT CURRENT; ELECTRICAL CONDUCTION MECHANISMS; ELECTRICAL PROPERTIES AND MEASUREMENTS; ENERGY LEVEL; EXCITED CARRIERS; FREE CARRIER DENSITY; GLASS SUBSTRATES; GLOW DISCHARGE REACTORS; HIGH TEMPERATURE; HIGHER TEMPERATURES; LOCALIZED STATE; LOW TEMPERATURES; OBSERVED DATA; PARALLEL PLATES; ROOM TEMPERATURE; SPACE CHARGE LIMITED CONDUCTION; TETRAETHYLORTHOSILICATE; TRAP DENSITY; VOLTAGE DEPENDENCE;

EID: 65649103033     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.089     Document Type: Article
Times cited : (6)

References (25)
  • 21
    • 65649094717 scopus 로고
    • Shen M., and Bell A.T. (Eds), American Chemical Society, Washington DC
    • Kryszewski M., Wrobel A.M., and Tyezkowski J. In: Shen M., and Bell A.T. (Eds). Plasma Polymerization. ACS Symposium Series vol. 108 (1979), American Chemical Society, Washington DC
    • (1979) ACS Symposium Series , vol.108
    • Kryszewski, M.1    Wrobel, A.M.2    Tyezkowski, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.