Controlling the optical properties of nanostructured TiO 2 thin films

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 5, 2009, Pages 940-943

  Hawkeye, Matthew M ^a   Brett, Michael J ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FILM MORPHOLOGY; GLANCING ANGLE DEPOSITION; HOMOGENEOUS MODELS; NANOSTRUCTURED FILMS; NANOSTRUCTURED TIO; PROXIMATION; REFLECTANCE MEASUREMENTS;

REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY;

REFLECTOMETERS;

EID: 65649088267     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881297     Document Type: Article

References (24)

1. M. M. Hawkeye and M. J. Brett, J. Vac. Sci. Technol. A 25, 1317 (2007).
2. T. Motohiro and Y. Taga, Appl. Opt. 28, 2466 (1989).
3. K. Kaminska, T. Brown, G. Beydaghyan, and K. Robbie, Appl. Opt. 42, 4212 (2003).
4. A. C. van Popta, M. M. Hawkeye, J. C. Sit, and M. J. Brett, Opt. Lett. 29, 2545 (2004).
5. M. F. Schubert, J.-Q. Xi, J. K. Kim, and E. F. Schubert, Appl. Phys. Lett. 90, 141115 (2007).
6. G. W. Mbise, D. Le Bellac, G. A. Niklasson, and C. G. Granqvist, J. Phys. D, Appl. Phys. 30, 2103 (1997).
7. Y.-J. Jen, C.-Y. Peng, and H.-H. Chang, Opt. Express 15, 4445 (2007).
8. I. Hodgkinson, Q. Wu, and J. Hazel, Appl. Opt. 37, 2653 (1998).
9. J. Gospodyn and J. C. Sit, Opt. Mater. 29, 318 (2006).
10. J.-Q. Xi, J. K. Kim, and E. F. Schubert, Nanolett. 5, 1385 (2005).
11. S. Wang, G. Xia, H. He, K. Yi, J. Shao, and Z. Fan, J. Alloys Compd. 431, 287 (2007).
12. A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, A. Duparré, E. Quesnel, D. Ristau, and S. Günster, Appl. Opt. 41, 2555 (2002).
13. M. Born and E. Wolf, Principles of Optics (Cambridge Uni- versity Press, Cambridge, 1999).
14. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes: The Art of Scientific Computing (Cambridge University Press, Cambridge, 2007).
15. M. S. Caceei, Anal. Chem. 61, 2327 (1989).
16. R. N. Tait, T. Smy, and M. J. Brett, Thin Solid Films 226, 196 (1993).
17. C. Buzea, G. Beydaghyan, C. Elliott, and K. Robbie, Nanotechnology 16, 1986 (2005).
18. H. A. Macleod, J. Vac. Sci. Technol. A 4, 418 (1986).
19. H. K. Pulker, G. Paesold, and E. Ritter, Appl. Opt. 15, 2986 (1976).
20. H. K. Pulker (ed.), Handbook of Optical Constants of Solids (Academic Press, New York, 1985).
21. F. Vratny and F. Micale, Trans. Faraday Soc. 59, 2739 (1963).
22. S. Kassam, I. J. Hodgkinson, Q. H. Wu, and S. C. Clough- ley, J. Opt. Soc. Am. A 12, 2009 (1995).
23. J. P. Borgogno, B. Lazarides, and E. Pelletier, Appl. Opt. 21, 4020 (1982).
24. W. G. Egan and D. E. Aspnes, Phys. Rev. B. 26, 5313 (1982).