Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films

Applied Optics

Volumn 41, Issue 13, 2002, Pages 2555-2560

  Tikhonravov, Alexander V ^a   Trubetskov, Michael K ^a   Kokarev, Michael A ^a   Amotchkina, Tatiana V ^a   Duparré, Angela ^b   Quesnel, Etienne ^c   Ristau, Detlev ^d   Günster, Stefan ^d  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^c CEA LETI   (France)

^d LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; LIGHT TRANSMISSION; MAGNESIUM COMPOUNDS; OPTICAL COATINGS; REFRACTIVE INDEX; SPECTROPHOTOMETRY; THIN FILMS;

OPTICAL PARAMETERS;

DIELECTRIC FILMS;

EID: 0036575647     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.002555     Document Type: Article

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