Near edge X-ray absorption fine structure spectroscopy studies of single-crystalline V 2O 5 nanowire arrays

Journal of Physical Chemistry C

Volumn 113, Issue 18, 2009, Pages 7639-7645

  Velazquez, Jesus M ^a   Jaye, Cherno ^b   Fischer, Daniel A ^b   Banerjee, Sarbajit ^a  

^a UNIVERSITY AT BUFFALO   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-DEPENDENT; BOND ORIENTATION; CRYSTAL GROWTH DIRECTION; EXPERIMENTAL SPECTRA; EXPERIMENTAL VERIFICATION; FRONTIER ORBITALS; NANOWIRE ARRAYS; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEXAFS SPECTROSCOPY; SELECTION RULES; SEMI-CONDUCTING PROPERTY; SENSITIVE PROBE; SINGLE-CRYSTALLINE; STRONG ANISOTROPY; THEORETICAL PREDICTION; VANADYL; VAPOR TRANSPORT;

ABSORPTION; ANISOTROPY; COBALT; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ELECTRIC WIRE; ELECTRON MOBILITY; ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; NANOWIRES; OXYGEN; PROBES; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; VANADIUM COMPOUNDS; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 65549093811     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp900809y     Document Type: Article

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