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Volumn 20, Issue 4, 2009, Pages 454-457

Thermal characteristic analysis of high-power LEDs by structure functions

Author keywords

High power LEDs; Metal core printed circuit board (MCPCB); Structure function; Thermal resistance

Indexed keywords

DIFFERENTIAL STRUCTURES; HIGH REPETITIONS; HIGH-POWER LEDS; METAL CORE PRINTED CIRCUIT BOARD (MCPCB); SAMPLING RESOLUTIONS; STRUCTURE FUNCTION; THERMAL CAPACITANCES; THERMAL CHARACTERISTICS; THERMAL CONDUCTIONS; THERMAL RESISTANCE; TRANSIENT DATUM; TRANSIENT TEMPERATURES;

EID: 65549088639     PISSN: 10050086     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (10)

References (11)
  • 1
    • 57649163659 scopus 로고    scopus 로고
    • Complex characterization of power LEDs: Simultaneous measurement of photometric/radiometric and thermal properties
    • Farkas G, Poppe A, Schanda J, et al. Complex characterization of power LEDs: simultaneous measurement of photometric/radiometric and thermal properties[A]. CIE LED Conference. 2004.
    • (2004) CIE LED Conference
    • Farkas, G.1    Poppe, A.2    Schanda, J.3
  • 2
    • 0038354891 scopus 로고    scopus 로고
    • Integrated circuits thermal measurement method-electrical test method (single semiconductor device)
    • JESD51-1-1995
    • JESD51-1-1995. Integrated circuits thermal measurement method-electrical test method (single semiconductor device)[s].
  • 3
    • 39449138152 scopus 로고    scopus 로고
    • Thermal transient characteristics of die attach in high power LED PKG
    • Kim H H, Choi S H, Shin S H, et al. Thermal transient characteristics of die attach in high power LED PKG[J]. Microelectronics Reliability, 2008, 48(3): 445-454.
    • (2008) Microelectronics Reliability , vol.48 , Issue.3 , pp. 445-454
    • Kim, H.H.1    Choi, S.H.2    Shin, S.H.3
  • 4
    • 37849186210 scopus 로고    scopus 로고
    • Comparison of transient thermal parameters for different die-connecting approaches
    • Yin J, van Wyk J, Odendaal W G. Comparison of transient thermal parameters for different die-connecting approaches[J]. Industry Applications, IEEE Transactions on, 2006, 42(6): 1403-1411.
    • (2006) Industry Applications, IEEE Transactions on , vol.42 , Issue.6 , pp. 1403-1411
    • Yin, J.1    van Wyk, J.2    Odendaal, W.G.3
  • 5
    • 0036212684 scopus 로고    scopus 로고
    • Determining partial thermal resistances with transient measurements, and using the method to detect die attach discontinuities
    • Rencz M, Szekely V, Morelli A, et al. Determining partial thermal resistances with transient measurements, and using the method to detect die attach discontinuities[A]. Semiconductor Thermal Measurement and Management[C]. 2002, 15-20.
    • (2002) Semiconductor Thermal Measurement and Management , pp. 15-20
    • Rencz, M.1    Szekely, V.2    Morelli, A.3
  • 6
    • 0035016450 scopus 로고    scopus 로고
    • The European project PROFIT: Prediction of temperature gradients influencing the quality of electronic products
    • Lasance C J M. The European project PROFIT: prediction of temperature gradients influencing the quality of electronic products[A]. Semiconductor Thermal Measurement and Management, 2001, 120-125.
    • (2001) Semiconductor Thermal Measurement and Management , pp. 120-125
    • Lasance, C.J.M.1
  • 7
    • 0024069775 scopus 로고
    • Fine structure of heat flow path in semiconductor devices: A measurement and identification method
    • Szekely V, VAN Bien T. Fine structure of heat flow path in semiconductor devices: A measurement and identification method[J]. Solid-state Electron, 1988, 31(9): 1363-1368.
    • (1988) Solid-state Electron , vol.31 , Issue.9 , pp. 1363-1368
    • Szekely, V.1    van Bien, T.2
  • 9
    • 15744378287 scopus 로고    scopus 로고
    • Properties of the structure function and its use for structure identification and for compact model generation
    • Micred
    • Micred. Properties of the structure function and its use for structure identification and for compact model generation.[EB/OL] www.micred.com/strfunc.html, 2000.
    • (2000)
  • 10
    • 0026191015 scopus 로고
    • On the representation of infinite-length distributed RC one-ports
    • Szekely V. On the representation of infinite-length distributed RC one-ports[J]. Circuits and Systems, IEEE Transactions on, 1991, 38(7): 711-719.
    • (1991) Circuits and Systems, IEEE Transactions on , vol.38 , Issue.7 , pp. 711-719
    • Szekely, V.1
  • 11
    • 15744368742 scopus 로고    scopus 로고
    • T3ster-the thermal transient tester
    • Micred
    • Micred. T3ster-the thermal transient tester[EB/OL]. http://www.micred.com/t3ster.html. 2004.
    • (2004)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.