SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 80, Issue 4, 2009, Pages

Characterizing piezoscanner hysteresis and creep using optical levers and a reference nanopositioning stage

(3) Xie, H a Rakotondrabe, M b Rgnier S a

a UNIVERSITÉ PIERRE ET MARIE CURIE (France)

b FEMTO ST INSTITUTE (France)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; AFM-BASED NANOMANIPULATION; ATOMIC FORCE MICROSCOPES; CLOSED LOOPS; DISPLACEMENT SENSORS; LATERAL TRACKING; NANOPOSITIONING STAGES; OPTICAL LEVERS; RELATIVE MOVEMENTS; SPATIAL DIRECTIONS; TAPPING MODES; VOLTAGE INPUTS;

CREEP; HYSTERESIS; MICROMANIPULATORS; NANOTECHNOLOGY;

ATOMIC FORCE MICROSCOPY;

EID: 65449187544 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3115184 Document Type: Article

Times cited : (27)

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