Structural analysis of a (Pt/Co)3 /IrMn multilayer: Investigation of sub-nanometric layers by tomographic atom probe

Journal of Applied Physics

Volumn 105, Issue 8, 2009, Pages

  Lard R ^a   Lechevallier, L ^a   Zarefy, A ^a   Bostel, A ^a   Juraszek, J ^a   Le Breton, J M ^a   Rodmacq, B ^b   Dieny, B ^b  

^a UNIVERSITÉ DE ROUEN   (France)

^b CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC CONCENTRATIONS; ATOMIC PLANES; ATOMIC SCALE; CHEMICAL COMPOSITIONS; CONCENTRATION PROFILES; DIRECT OBSERVATIONS; LASER-ASSISTED; NANOMETRIC; PERPENDICULAR EXCHANGE BIAS; REAL SPACES; STRUCTURAL CHARACTERIZATIONS; SUBNANOMETRIC LAYERS; THREE-DIMENSIONAL RECONSTRUCTION; TOMOGRAPHIC ATOM PROBES; X-RAY REFLECTOMETRY;

IRIDIUM COMPOUNDS; MULTILAYERS; PLATINUM; PROBES; REFLECTION; REFLECTOMETERS; SODIUM COMPOUNDS; SPACE PROBES; STRUCTURAL ANALYSIS; TANTALUM; THREE DIMENSIONAL;

ATOMS;

EID: 65449158323     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3106636     Document Type: Article

References (33)

1. J. Nogús and I. K. Schuller, J. Magn. Magn. Mater. 0304-8853 10.1016/S0304-8853(98)00266-2 192, 203 (1999).
2. W. H. Meiklejohn and C. P. Bean, Phys. Rev. 102, 1413 (1956).
3. B. Dieny, V. S. Speriosu, S. S. P. Parkin, B. A. Gurney, D. R. Wilhoit, and D. Mauri, Phys. Rev. B 0163-1829 10.1103/PhysRevB.43.1297 43, 1297 (1991).
4. S. Tehrani, J. M. Slaughter, M. Deherrera, B. N. Engel, N. D. Rizzo, J. Slater, M. Durlam, R. W. Dave, J. Janesky, B. Butcher, K. Smith, and G. Grynkewich, Proc. IEEE 0018-9219 10.1109/JPROC.2003.811804 91, 703 (2003).
5. S. Maat, K. Takano, S. S. P. Parkin, and E. E. Fullerton, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.87.087202 87, 087202 (2001).
6. Z. Y. Liu and S. Adenwalla, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.91.037207 91, 037207 (2003).
7. J. Sort, B. Dieny, M. Fraune, C. Koenig, F. Lunnebach, B. Beschoten, and G. Güntherodt, Appl. Phys. Lett. 0003-6951 10.1063/1.1737484 84, 3696 (2004).
8. C. H. Marrows, Phys. Rev. B 0163-1829 10.1103/PhysRevB.68.012405 68, 012405 (2003).
9. F. Garcia, J. Sort, B. Rodmacq, S. Auffret, and B. Dieny, Appl. Phys. Lett. 0003-6951 10.1063/1.1619562 83, 3537 (2003).
10. J. Sort, V. Baltz, F. Garcia, B. Rodmacq, and B. Dieny, Phys. Rev. B 0163-1829 10.1103/PhysRevB.71.054411 71, 054411 (2005).
11. S. van Dijken, J. Moritz, and J. M. D. Coey, J. Appl. Phys. 0021-8979 10.1063/1.1861964 97, 063907 (2005).
12. J. Sort, F. Garcia, B. Rodmacq, S. Auffret, and B. Dieny, J. Magn. Magn. Mater. 272-276, 355 (2004). 0304-8853
13. R. F. Jiang and C. H. Lai, J. Magn. Magn. Mater. 272-276, 2312 (2004). 0304-8853
14. P. F. Carcia, J. Appl. Phys. 0021-8979 10.1063/1.340404 63, 5066 (1988).
15. B. N. Engel, C. D. England, R. A. Van Leeuwen, M. H. Wiedmann, and C. M. Falco, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.67.1910 67, 1910 (1991).
16. H. Fuke, K. Saito, Y. Kamiguchi, H. Iwasaki, and M. Sahashi, J. Appl. Phys. 0021-8979 10.1063/1.364920 81, 4004 (1997).
17. A. J. Devasahayam, P. J. Sides, and M. Kryder, J. Appl. Phys. 0021-8979 10.1063/1.367550 83, 7216 (1998).
18. N. Nakajima, T. Koide, T. Shidara, H. Miyauchi, H. Fukutani, A. Fujimori, K. Iio, T. Katayama, M. Nyvlt, and Y. Suzuki, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.81.5229 81, 5229 (1998).
19. D. Blavette, B. Deconihout, A. Bostel, J. M. Sarrau, M. Bouet, and A. Menand, Rev. Sci. Instrum. 0034-6748 10.1063/1.1144382 64, 2911 (1993).
20. D. Blavette, B. Deconihout, S. Chambreland, and A. Bostel, Ultramicroscopy 0304-3991 10.1016/S0304-3991(97)00085-5 70, 115 (1998).
21. X. W. Zhou, H. N. G. Wadley, R. A. Johnson, D. J. Larson, N. Tabat, A. Cerezo, A. K. Petford-Long, G. D. W. Smith, P. H. Clifton, R. L. Martens, and T. F. Kelly, Acta Mater. 1359-6454 10.1016/S1359-6454(01)00287-7 49, 4005 (2001).
22. D. J. Larson, A. K. Petford-Long, Y. Q. Ma, and A. Cerezo, Acta Mater. 1359-6454 10.1016/j.actamat.2004.03.015 52, 2847 (2004).
23. D. J. Larson, Thin Solid Films 505, 16 (2006).
24. A. Grenier, R. Lard́, E. Cadel, F. Vurpillot, J. Juraszek, J. Teillet, and N. Tiercelin, J. Appl. Phys. 0021-8979 10.1063/1.2761825 102, 033912 (2007).
25. B. Gault, F. Vurpillot, A. Vella, M. Gilbert, A. Menand, D. Blavette, and B. Deconihout, Rev. Sci. Instrum. 0034-6748 10.1063/1.2194089 77, 043705 (2006).
26. A. A. Ayon, R. Braff, C. C. Lin, H. H. Swain, and M. A. Schmidt, J. Electrochem. Soc. 0013-4651 10.1149/1.1391611 146, 339 (1999).
27. P. Bas, A. Bostel, B. Deconihout, and D. Blavette, Appl. Surf. Sci. 87-88, 298 (1995). 0169-4332
28. SIMULREFLECT at http://www-drecam.cea.fr/llb/prism/programs.html.
29. J. Sort, B. Dieny, and J. Nogús, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.104412 72, 104412 (2005).
30. J. Kanak, T. Stobiecki, and S. Van Dijken, IEEE Trans. Magn. 44, 238 (2008). 0018-9464
31. M. K. Miller, A. Cerezo, M. G. Hetherington, and G. D. W. Smith, Atom Probe Field Ion Microscopy (Clarendon, Oxford, 1996).
32. X. Ji, H. Ju, D. E. Mac Cready, and K. M. Krishnan, J. Appl. Phys. 0021-8979 10.1063/1.2137878 98, 116101 (2005).
33. Z. G. Li and P. F. Carcia, J. Appl. Phys. 71, 844 (1992). 0021-8979