Exchange bias of NiO/FeNi ordered nanocaps on curved substrate

Journal of Applied Physics

Volumn 105, Issue 8, 2009, Pages

  Zhang, Y J ^a   Wang, Y X ^a,b   Meng, X D ^a   Liu, Y ^a   Ding, X ^a   Yang, J H ^a  

^a JILIN NORMAL UNIVERSITY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BI LAYERS; COLLOIDAL SPHERES; CURVED SUBSTRATES; EXCHANGE BIAS; EXCHANGE-BIAS FIELDS; FERROMAGNETIC LAYERS; NANO-DOT ARRAYS; NANOCAPS; SELF-ASSEMBLY TECHNOLOGIES; SI SUBSTRATES; SI WAFERS; SPHERE SURFACES; SPHERICAL SURFACES; THICKNESS VARIATIONS;

SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON WAFERS; SPHERES; TRANSMISSION ELECTRON MICROSCOPY;

SUBSTRATES;

EID: 65449143500     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3087739     Document Type: Article

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