Exchange biasing in polycrystalline thin film microstructures

Journal of Applied Physics

Volumn 87, Issue 9 II, 2000, Pages 5049-5051

  Yu, J ^a   Kent, A D ^a   Parkin, S S P ^b  

^a POLYTECHNIC UNIVERSITY   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000375657     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373244     Document Type: Article

References (15)

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