Influence of the surface free energy of silane-coupled mica substrate on the fixing and straightening of DNA

Thin Solid Films

Volumn 517, Issue 15, 2009, Pages 4425-4431

  Sasou, Megumi ^a   Sugiyama, Shigeru ^b   Ishida, Takao ^a   Ohtani, Toshio ^b   Miyake, Koji ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL FOOD RESEARCH INSTITUTE   (Japan)

Author keywords

Atomic force microcopy; DNA; Fluorescence microscopy; Silane; Surface free energy; X ray photoelectron spectroscopy

Indexed keywords

3-AMINOPROPYLTRIETHOXYSILANE; ATOMIC FORCE MICROCOPY; DISPERSION FORCES; HYDROGEN BONDINGS; METHYLTRIMETHOXYSILANE; MICA SUBSTRATES; ORDER OF MAGNITUDES; POLAR FORCES; SURFACE FREE ENERGY;

ATOMIC SPECTROSCOPY; ATOMS; DNA; ELECTRON SPECTROSCOPY; FLUORESCENCE; FLUORESCENCE MICROSCOPY; FREE ENERGY; GAS ADSORPTION; GENES; HYDROGEN; MICA; NUCLEIC ACIDS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SILANES; SILICATE MINERALS; SPECTRUM ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

SUBSTRATES;

EID: 65449128023     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.016     Document Type: Article

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