SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 91, Issue 1-4, 2002, Pages 139-149

DC electric-field-induced DNA stretching for AFM and SNOM studies

(5) Kim, J M a,b Ohtani, T a Park, J Y c Chang, S M c Muramatsu, H b

a NATIONAL FOOD RESEARCH INSTITUTE (Japan)

b SEIKO INSTRUMENTS INC (Japan)

c Dong A University (South Korea)

Author keywords

AFM; DNA; NSOM; SNOM

Indexed keywords

DNA; ELECTRIC FIELDS; ELECTRODES; MAGNESIUM PRINTING PLATES; MICA; OPTICAL MICROSCOPY;

OPTICAL RESOLUTION;

ATOMIC FORCE MICROSCOPY;

DNA; MAGNESIUM ION; MICA;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTRODE; MOLECULE; OPTICAL RESOLUTION; PRODUCTIVITY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

ALUMINUM SILICATES; BACTERIOPHAGE LAMBDA; DNA, VIRAL; ELECTRICITY; ELECTRODES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NUCLEIC ACID CONFORMATION; SURFACE PROPERTIES;

MICA;

EID: 0036326623 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00093-1 Document Type: Article

Times cited : (23)

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