Development of a real-time beam current monitoring system for microbeam scanning-PIXE analysis using a ceramic channel electron multiplier

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 12-13, 2009, Pages 2032-2035

  Ishikawa, Takahiro ^a   Iso, Hiroyuki ^a   Oikawa, Masakazu ^a   Konishi, Teruaki ^a   Kitamura, Hisashi ^a   Higuchi, Yuichi ^a   Suya, Noriyoshi ^a   Hamano, Tsuyoshi ^a   Imaseki, Hitoshi ^a  

^a Fundamental Technology   (Japan)

Author keywords

Beam current monitoring; CEM; Charge integration; Microbeam; PIXE; Quantitative analysis; Secondary electron

Indexed keywords

BEAM CURRENT MONITORING; CEM; CHARGE INTEGRATION; MICROBEAM; PIXE; QUANTITATIVE ANALYSIS; SECONDARY ELECTRON;

CARBON FILMS; CERAMIC MATERIALS; ELECTRONS; FREQUENCY MULTIPLYING CIRCUITS; HEAVY METALS; MAMMALS; MONITORING; POSITIVE IONS; SCANNING; SECONDARY EMISSION; TWO DIMENSIONAL;

ELECTRON MULTIPLIERS;

EID: 65349180097     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.03.011     Document Type: Article

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