The scanning microbeam PIXE analysis facility at NIRS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 210, Issue , 2003, Pages 42-47

  Imaseki, Hitoshi ^a   Yukawa, Masae ^a   Watt, Frank ^b   Ishikawa, Takahiro ^a   Iso, Hiroyuki ^a   Hamano, Tsuyoshi ^a   Matsumoto, Kenichi ^a,c   Yasuda, Nakahiro ^a  

^a NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c TOHO UNIVERSITY   (Japan)

Author keywords

Elemental distribution; Mapping; Microbeam; Particle; PIXE

Indexed keywords

ELECTROSTATIC ACCELERATORS; EMISSION SPECTROSCOPY; HIGH ENERGY PHYSICS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PARTICLE OPTICS; PROTON BEAMS; RADIOLOGY; SCANNING; X RAY ANALYSIS;

MICROBEAMS; SCANNING TRANSMISSION ION MICROSCOPY;

ION BEAMS;

EID: 0042014031     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01002-4     Document Type: Conference Paper

References (4)

1. Yukawa M., Imaseki H. Int. J. PIXE. 10(1-2):2000;P71.
2. Imaseki H., Yukawa M. Int. J. PIXE. 10(3-4):2000;P77.
3. Grime G.W., Dawson M., Marsh M., McArther I.C., Watt F. Nucl. Instr. and Meth. B. 54:1991;52.
4. Watt F., Grime G.W. Principles and Applications of High Energy Ion Microbeam. 1987;Adam Hilger, Bristol.