Raman study of ceo2 texture as a ceo2ila 2zr2o7ini architecture for buffer coated layer in the conductors

Applied Spectroscopy

Volumn 63, Issue 4, 2009, Pages 401-406

  Jimenez, C ^a   Caroff, T ^a   Bartasyte, A ^a   Margueron, A ^a   Abrutis, A ^a   Chaix Pluchery, O ^a   Weiss, F ^b  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b VILNIUS UNIVERSITY   (Lithuania)

Author keywords

Cerium oxide; Coated conductors; Superconductors; Thin films

Indexed keywords

CERIUM OXIDE; COATED CONDUCTORS; COATED LAYERS; CRYSTALLINE QUALITIES; CRYSTALLOGRAPHIC QUALITIES; EPITAXIAL STRUCTURES; INTEGRATED INTENSITIES; METAL-ORGANIC CHEMICAL VAPOR DEPOSITIONS; METAL-ORGANIC DECOMPOSITIONS; NON-DESTRUCTIVE CHARACTERIZATIONS; PARALLEL POLARIZATIONS; QUALITY FACTORS; RAMAN INTENSITIES; RAMAN MODES; RAMAN STUDIES; ROTATION ANGLES; SUPERCONDUCTING PERFORMANCE; SUPERCONDUCTORS; X-RAY DIFFRACTIONS;

ARCHITECTURAL ACOUSTICS; CERIUM; CERIUM COMPOUNDS; CHEMICAL VAPOR DEPOSITION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); OXIDE SUPERCONDUCTORS; POLARIZATION; SUPERCONDUCTIVITY; TEXTURES; THIN FILMS; X RAY DIFFRACTION; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIUM;

OXIDE FILMS;

EID: 65349104074     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370209787944334     Document Type: Article

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