Masked fake face detection using radiance measurements

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 26, Issue 4, 2009, Pages 760-766

  Kim, Youngshin ^a   Na, Jaekeun ^a   Yoon, Seongbeak ^a   Yi, Juneho ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FACE DETECTIONS; FACE VERIFICATION SYSTEMS; FACIAL SKINS; FEATURE SPACES; FEATURE VECTORS; FISHER'S LINEAR DISCRIMINANTS; LINEARLY SEPARABLE; MASK MATERIALS; RADIANCE MEASUREMENTS;

FACE RECOGNITION;

EID: 65249190155     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.26.000760     Document Type: Article

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