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Volumn 15, Issue 4, 2000, Pages 722-727
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Face detection and precise eyes location
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Author keywords
[No Author keywords available]
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Indexed keywords
FEATURE EXTRACTION;
LOCATION;
PATTERN RECOGNITION SYSTEMS;
FACIAL FEATURE LOCATION;
GEOMETRIC PATTERNS;
INVARIANT PROPERTIES;
MULTISCALE FILTER;
RECOGNITION PROCESS;
REGION INFORMATION;
STRUCTURAL INFORMATION;
STRUCTURAL MODELING;
FACE RECOGNITION;
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EID: 33750902932
PISSN: 10514651
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (91)
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References (10)
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