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Volumn 81, Issue 8, 2009, Pages 2953-2961

Electrokinetic transport in microchannels with random roughness

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC LENGTHS; COMPLEX GEOMETRIES; DEBYE LENGTHS; DOUBLE LAYERS; ELECTRO-OSMOTIC FLOWS; ELECTROKINETIC TRANSPORTS; EXTERNAL ELECTRIC FIELDS; GEOMETRIC CHARACTERISTICS; GOVERNING EQUATIONS; GROWTH METHODS; HIGH EFFICIENCIES; KINETIC TRANSPORTS; NUMBER DENSITIES; POISSON-BOLTZMANN; RANDOM FACTORS; RANDOM GENERATIONS; RANDOM ROUGHNESS; RATE INCREASE; RATE REDUCTIONS; ROUGH CHANNELS; ROUGHNESS ELEMENTS; SMOOTH CHANNELS; STATISTICAL PARAMETERS; THREE-DIMENSIONAL MICROSTRUCTURES;

EID: 65249147728     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac802569n     Document Type: Article
Times cited : (74)

References (50)
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    • Wang, C. Y. Chem. Rev. 2004, 104, 4727-4765.
    • (2004) Chem. Rev , vol.104 , pp. 4727-4765
    • Wang, C.Y.1
  • 28
    • 0013404187 scopus 로고
    • Dukhin, S. S, Derjaguin, B. V, Eds, Wiley: New York
    • Electrokinetic phenomena; Dukhin, S. S., Derjaguin, B. V., Eds.; Wiley: New York, 1974.
    • (1974) Electrokinetic phenomena
  • 36
    • 0029016182 scopus 로고    scopus 로고
    • Honig, B.; A, N. Science 1995, 268, 1144-1149.
    • Honig, B.; A, N. Science 1995, 268, 1144-1149.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.