Laguerre-Gaussian radial Hilbert transform for edge-enhancement Fourier transform x-ray microscopy

Optics Express

Volumn 17, Issue 7, 2009, Pages 5533-5539

  Bokor, Nándor ^a,b   Iketaki, Yoshinori ^c,d  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d OLYMPUS CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

X RAY MICROSCOPES;

EDGE ENHANCEMENTS; HIGH CONTRAST; LAGUERRE-GAUSSIAN; OPTICAL PATH DIFFERENCE; RADIAL HILBERT TRANSFORMS; SOFT X-RAY MICROSCOPY; X RAY MICROSCOPY; ZONE PLATES;

MATHEMATICAL TRANSFORMATIONS;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; FOURIER ANALYSIS; IMAGE QUALITY; METHODOLOGY; MICROSCOPY; NORMAL DISTRIBUTION; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; FOURIER ANALYSIS; MICROSCOPY; MODELS, STATISTICAL; NORMAL DISTRIBUTION; PATTERN RECOGNITION, AUTOMATED; RADIOGRAPHIC IMAGE ENHANCEMENT; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 65249145197     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.005533     Document Type: Article

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