The influence of beam divergence on ion-beam induced surface patterns

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 8-9, 2009, Pages 1407-1411

  Kree, R ^a   Yasseri, T ^a   Hartmann, A K ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Beam divergence; Continuum theory; Ion beam sputtering; Monte Carlo method; Pattern formation

Indexed keywords

ANGLE OF INCIDENCES; BEAM DIVERGENCE; BEAM PARAMETERS; BEAM PROFILES; CONTINUUM THEORY; EMERGING PATTERNS; GENERIC EFFECTS; HEIGHT PROFILES; ION-BEAM SPUTTERING; MONTE CARLO MODELS; MONTE CARLO SIMULATIONS; PATTERN FORMATION; QUALITATIVE CHANGES; RANDOM PARAMETERS; RIPPLE PATTERNS; SECONDARY IONS; SELF-ORGANIZED; SURFACE PATTERNS;

CONTINUUM MECHANICS; ION BEAMS; IONS; PILES; TEXTILE PRINTING;

MONTE CARLO METHODS;

EID: 65249144629     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.01.064     Document Type: Article

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