Random number generation by a two-dimensional crystal of protein molecules

Langmuir

Volumn 25, Issue 8, 2009, Pages 4293-4297

  Ikezoe, Yasuhiro ^a   Kim, Song Ju ^b   Yamashita, Ichiro ^c,d   Hara, Masahiko ^a,b,e  

^a RIKEN   (Japan)

^b Hanyang University   (South Korea)

^c PANASONIC CORPORATION   (Japan)

^d NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^e TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYPTOGRAPHIC DEVICES; INNER STRUCTURES; LAYER CRYSTALS; MOLAR RATIOS; MOLECULAR DISTRIBUTIONS; MOLECULAR PATTERNS; NANO-METER SCALE; PROTEIN MOLECULES; SELF- ASSEMBLIES; SHELL STRUCTURES; STATISTICAL ANALYSIS; TWO-DIMENSIONAL CRYSTALS;

PHASE SEPARATION;

RANDOM NUMBER GENERATION;

APOFERRITIN; FERRITIN; PROTEIN; WATER;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER SIMULATION; CRYSTALLIZATION; MATHEMATICS; MONTE CARLO METHOD; PROBABILITY; SCANNING ELECTRON MICROSCOPY; STATISTICAL MODEL; SURFACE PROPERTY; THEORETICAL MODEL;

ALGORITHMS; APOFERRITINS; COMPUTER SIMULATION; CRYSTALLIZATION; FERRITINS; MATHEMATICS; MICROSCOPY, ELECTRON, SCANNING; MODELS, STATISTICAL; MODELS, THEORETICAL; MONTE CARLO METHOD; PROBABILITY; PROTEINS; SURFACE PROPERTIES; WATER;

EID: 65249139411     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9000413     Document Type: Article

References (40)

1. Rutherford, E.; Geiger, H. Philos. Mag. 1910, 20, 698-707.
2. VanWiggeren, G. D.; Roy, R. Science 1998, 279, 1198-1200.
3. Uchida, A.; Amano, K.; Inoue, M.; Hirano, K.; Naito, S.; Someya, H.; Oowada, I.; Kurashige, T.; Shiki, M.; Yoshimori, S.; Yoshimura, K.; Davis, P. Nat. Photon. 2008, 2, 728-732.
4. Gleeson, J. T. Appl. Phys. Lett. 2002, 81, 1949-1951.
5. Stipcevic, M.; Rogina, B. M. Rev. Sci. Instrum. 2007, 78, 045104.
6. Schneier, B. Applied Cryptography: Protocols, Algorithms, and Source Code in C, 2nd ed.; Wiley: New York, 1996.
7. Blum, L.; Blum, M.; Shub, M. SIAM J. Comput. 1986, 15, 364-383.
8. Matsumoto, M.; Nishimura, T. ACM Trans. Model. Comput. Simul. 1998, 8, 3-30.
9. Stephen, W. Adv. Appl. Math. 1986, 7, 123-169.
10. Kim, S. J.; Umeno, K. J. Signal Processing 2005, 9, 71-78.
11. Meldrum, F. C.; Heywood, B. R.; Mann, S. Science 1992, 257, 522-523.
12. Klem, M. T.; Resnick, D. A.; Gilmore, K.; Young, M.; Idzerda, Y. U.; Douglas, T. J. Am. Chem. Soc. 2007, 129, 197-201.
13. Uchida, M.; Flenniken, M. L.; Allen, M.; Willits, D. A.; Crowley, B. E.; Brumfield, S.; Willis, A. F.; Jackiw, L.; Jutila, M.; Young, M. J.; Douglas, T. J. Am. Chem. Soc. 2006, 128, 16626-16633,
14. Wong, K. K. W.; Mann, S. Adv. Mater. 1996, 8, 928-932.
15. Iwahori, K.; Enomoto, T.; Furusho, H.; Miura, A.; Nishio, K.; Mishima, Y.; Yamashita, I. Chem. Mater. 2007, 19, 3105-3111.
16. Hikono, T.; Matsumura, T.; Miura, A.; Uraoka, Y.; Fuyuki, T.; Takeguchi, M.; Yoshii, S.; Yamashita, I. Appl. Phys. Lett. 2006, 88, 023108.
17. Miura, A.; Hikono, T.; Matsumura, T.; Yano, H.; Hatayama, T.; Uraoka, Y.; Fuyuki, T.; Yoshii, S.; Yamashita, I. Jpn. J. Appl. Phys. Part 2 2006, 45, L1-L3.
18. Bonard, J. M.; Chauvin, P.; Klinke, C. Nano Lett. 2002, 2, 665-667.
19. Wiedenheft, B.; Flenniken, M. L.; Allen, M. A.; Young, M.; Douglas, T. Soft Matter 2007, 3, 1091-1098.
20. Kirimura, H.; Uraoka, Y.; Fuyuki, T.; Okuda, M.; Yamashita, I. Appl. Phys. Lett. 2005, 86, 262106.
21. Bartlett, P.; Ottewill, R. H.; Pusev, P. N. Phys. Rev. Lett. 1992, 68, 3801.
22. Kiely, C. J.; Fink, J.; Brust, M.; Bethell, D.; Schiffrin, D. J. Nature 1998, 396, 444.
23. Leunissen, M. E.; Christova, C. G.; Hynninen, A.-P.; Royall, C. P.; Campbell, A. I.; Imhof, A.; Dijkstra, M.; van Roij, R.; van Blaaderen, A. Nature 2005, 437, 235.
24. Shevchenko, E. V.; Talapin, D. V.; Kotov, N. A.; O'Brien, S.; Murray, C. B. Nature 2006, 439, 55.
25. Cheon, J.; Park, J. I.; Choi, J. S.; Jun, Y. W.; Kim, S.; Kim, M. G.; Kim, Y. M.; Kim, Y. J. Proc. Natl. Acad. Sci. U.S.A. 2006, 103, 3023-3027.
26. Zheng, J.; Constantinou, P. E.; Micheel, C.; Alivisatos, A. P.; Kiehl, R. A.; Seeman, N. C. Nano Lett. 2006, 6, 1502-1504.
27. Shevchenko, E. V.; Ringler, M.; Schwemer, A.; Talapin, D. V.; Klar, T. A.; Rogach, A. L.; Feldmann, J.; Alivisatos, A. P. J. Am. Chem. Soc. 2008, 750, 3274-3275.
28. Theobald, J. A.; Oxtoby, N. S.; Phillips, M. A.; Champness, N. R.; Beton, P. H. Nature 2003, 424, 1029.
29. Shevchenko, E. V.; Kortright, J.; Talapin, D. V.; Aloni, S.; Alivisatos, A. P. Adv. Mater. 2007, 19, 4183-4188.
30. Lewis, P. A.; Smith, R. K.; Kelly, K. F.; Bumm, L. A.; Reed, S. M.; Clegg, R. S.; Gunderson, J. D.; Hutchison, J. E.; Weiss, P. S. J. Phys. Chem. B 2001, 105, 10630-10636.
31. Sano, K.; Ajima, K.; Iwahori, K.; Yudasaka, M.; Iijima, S.; Yamashita, I.; Shiba, K. Small 2005, 1, 826-832.
32. Matsui, T.; Matsukawa, N.; Iwahori, K.; Sano, K. I.; Shiba, K.; Yamashita, I. Langmuir 2007, 23, 1615-1618.
33. Ikezoe, Y.; Kumashiro, Y.; Tamada, K.; Matsui, T.; Yamashita, I.; Shiba, K.; Hara, M. Langmuir 2008, 24, 12836-12841.
34. Yamashita, I. Thin Solid Films 2001, 393, 12-18.
35. http://csrc.nist.gov/publications/fips/fips140-2/fips1402.pdf Although the four statistical tests used here have been omitted from the document, they are still used frequently to estimate randomness of a bit sequence.
36. Kim, S. J.; Umeno, K.; Hasegawa, A. ISM Rep. Res. Educ. 2003, 17, 326-327.
37. http://csrc.nist.gov/groups/ST/toolkit/rng/documents/SP800-22rev1.pdf.
38. Kim, S. J.; Umeno, K.; Hasegawa, A. Tech. Rep. IEICE 2003, 103, 21-27.
39. Krisovitch, S. M.; Regen, S. L. J. Am. Chem. Soc. 1992, 114, 9828-9835.
40. Takami, T.; Delamarche, E.; Michel, B.; Gerber, C.; Wolf, H.; Ringsdorf, H. Langmuir 1995, 11, 3876-3881.