Dielectric constant at x -band microwave frequencies for multiferroic BiFeO3 thin films

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Abdul Ahad, Faris B ^a,b   Hung, D S ^a,c   Yao, Y D ^d   Lee, S F ^a   Tu, C S ^e   Wang, T H ^e   Chen, Y Y ^a   Fu, Y P ^f  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c MING CHUAN UNIVERSITY   (Taiwan)

^d TATUNG UNIVERSITY   (Taiwan)

^e FU JEN CATHOLIC UNIVERSITY   (Taiwan)

^f NATIONAL DONG HWA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; DIELECTRIC RESPONSE; DIELECTRIC TUNABILITY; HIGH PRECISION; IMAGINARY PARTS; MEASURING FREQUENCIES; MICROWAVE RESONATORS; MULTIFERROIC; ROOM TEMPERATURES; X-BAND MICROWAVE FREQUENCIES;

CERAMIC CAPACITORS; FREQUENCY RESPONSE; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; MICROWAVE DEVICES; MICROWAVE FREQUENCIES; PERMITTIVITY; SEMICONDUCTING BISMUTH COMPOUNDS;

MAGNETIC THIN FILMS;

EID: 65249115982     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3068477     Document Type: Article

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